Test systems

Individually configurable basic systems

Basic systems for:

• Function test
• In-Circuit test
• End-of-line test
• Boundary scan
• Flashing
• Parallel test + combined test
• (Power) semiconductor test

Measuring and switching modules

cPCI - PXI - PXIe

Plug-in modules to:

• generate
• switch
• measure

Signals.

Options

System extensions

Useful features for a complete test system:

• Vacuum/compressed air supply
• Adapter tightening mechanism
• internal controller
• fully-fledged workstation GTE1000